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Optimization of Power Chain for Flying Car Test Bench Systems: A Precise MOSFET Selection Scheme Based on High-Voltage Stimulus, High-Current Load Simulation, and Auxiliary Power Management
Flying Car Test Bench Power Chain Optimization Topology

Flying Car Test Bench Power Chain Overall Topology

graph LR %% High-Voltage Stimulus Source Section subgraph "High-Voltage DC Stimulus & Energy Recovery" AC_GRID["Grid/Utility Input
400VAC 3-Phase"] --> PFC_STAGE["Active PFC Stage"] PFC_STAGE --> DC_LINK["High-Voltage DC Link
800-1000VDC"] subgraph "Bidirectional DC Source/Sink" VBP117_HV["VBP117MC06
1700V SiC MOSFET
50-200kHz Switching"] end DC_LINK --> VBP117_HV VBP117_HV --> STIMULUS_BUS["High-Voltage Stimulus Bus
To DUT Powertrain"] STIMULUS_BUS --> ENERGY_RECOVERY["Regenerative Energy Recovery
to Grid/Storage"] ENERGY_RECOVERY --> VBP117_HV SIC_CONTROLLER["SiC Digital Controller
High-Bandwidth"] --> SIC_DRIVER["Isolated Gate Driver
with Desat Protection"] SIC_DRIVER --> VBP117_HV end %% High-Current Load Simulation Section subgraph "High-Current Actuator/Dynamometer Drive" LOAD_DC_BUS["Low-Voltage DC Bus
48-60VDC"] --> INVERTER_BRIDGE["3-Phase Inverter Bridge"] subgraph "Inverter Low-Side Switch Array" VBL1615_1["VBL1615A
60V/120A MOSFET
Rds(on)=7mΩ"] VBL1615_2["VBL1615A
60V/120A MOSFET
Rds(on)=7mΩ"] VBL1615_3["VBL1615A
60V/120A MOSFET
Rds(on)=7mΩ"] end INVERTER_BRIDGE --> VBL1615_1 INVERTER_BRIDGE --> VBL1615_2 INVERTER_BRIDGE --> VBL1615_3 VBL1615_1 --> DYNO_LOAD["Dynamometer/Load Simulator
High-Torque Ripple"] VBL1615_2 --> DYNO_LOAD VBL1615_3 --> DYNO_LOAD INVERTER_CONTROLLER["High-Fidelity PWM Controller"] --> GATE_DRIVER_HC["High-Current Gate Driver"] GATE_DRIVER_HC --> VBL1615_1 GATE_DRIVER_HC --> VBL1615_2 GATE_DRIVER_HC --> VBL1615_3 end %% Auxiliary Power Management Section subgraph "Multi-Channel Auxiliary Power & Sensor Management" AUX_DC_SUPPLY["Auxiliary DC Supply
Up to 250VDC"] --> SUB_SYSTEMS["Test Bench Sub-Systems"] subgraph "Intelligent Power Switches" VBMB2251_SENSORS["VBMB2251K
-250V/-7A P-MOSFET
Sensor Arrays"] VBMB2251_SAFETY["VBMB2251K
-250V/-7A P-MOSFET
Safety Interlocks"] VBMB2251_CONTROL["VBMB2251K
-250V/-7A P-MOSFET
Controller Power"] end AUX_DC_SUPPLY --> VBMB2251_SENSORS AUX_DC_SUPPLY --> VBMB2251_SAFETY AUX_DC_SUPPLY --> VBMB2251_CONTROL VBMB2251_SENSORS --> SENSOR_CLUSTER["Isolated Sensor Suites
Voltage/Current/Vibration"] VBMB2251_SAFETY --> SAFETY_LOOP["Emergency Shutdown
Fault Isolation"] VBMB2251_CONTROL --> CONTROL_UNITS["Test Sequencer & PLC"] TEST_SEQUENCER["Test Sequencer/Safety PLC"] --> LEVEL_SHIFTER["Opto-Isolator/Level Shifter"] LEVEL_SHIFTER --> VBMB2251_SENSORS LEVEL_SHIFTER --> VBMB2251_SAFETY LEVEL_SHIFTER --> VBMB2251_CONTROL end %% System Integration & Communication MASTER_CONTROLLER["Master Test Controller"] --> DATA_ACQUISITION["High-Speed Data Acquisition"] DATA_ACQUISITION --> SENSOR_CLUSTER MASTER_CONTROLLER --> INVERTER_CONTROLLER MASTER_CONTROLLER --> SIC_CONTROLLER MASTER_CONTROLLER --> TEST_SEQUENCER MASTER_CONTROLLER --> DIGITAL_TWIN["Digital Twin Integration
Predictive Maintenance"] %% Thermal Management Hierarchy subgraph "Three-Level Thermal Management" COOLING_LEVEL1["Level 1: Liquid Cooling"] --> VBL1615_1 COOLING_LEVEL2["Level 2: Forced Air Cooling"] --> VBP117_HV COOLING_LEVEL3["Level 3: Convection/PCB"] --> VBMB2251_SENSORS TEMP_SENSORS["NTC/PTC Sensors"] --> THERMAL_MGR["Thermal Management Controller"] THERMAL_MGR --> COOLING_LEVEL1 THERMAL_MGR --> COOLING_LEVEL2 end %% Protection Circuits subgraph "System Protection Network" SNUBBER_SIC["RC Snubber Network"] --> VBP117_HV FREEWHEEL_DIODES["Freewheeling Diodes"] --> VBL1615_1 TVS_PROTECTION["TVS Array"] --> VBMB2251_SENSORS CURRENT_PROTECTION["Desaturation Protection"] --> SIC_DRIVER VOLTAGE_PROTECTION["Over-Voltage Clamp"] --> GATE_DRIVER_HC end %% Style Definitions style VBP117_HV fill:#e8f5e8,stroke:#4caf50,stroke-width:2px style VBL1615_1 fill:#e3f2fd,stroke:#2196f3,stroke-width:2px style VBMB2251_SENSORS fill:#fff3e0,stroke:#ff9800,stroke-width:2px style MASTER_CONTROLLER fill:#fce4ec,stroke:#e91e63,stroke-width:2px

Preface: Building the "Nervous System" for Vertiport Test Infrastructure – Discussing the Systems Thinking Behind Power Device Selection
In the emerging field of vertiport-integrated flying car test benches, an outstanding test system is not merely an integration of power supplies, loads, and data acquisition units. It is, more importantly, a precise, dynamic, and reliable electrical "stress applicator" and "performance probe." Its core capabilities—high-fidelity simulation of both flight and road operational profiles, high-bandwidth dynamic load response, and the reliable coordination of myriad auxiliary sensors and controls—are all deeply rooted in a fundamental module that determines the system's fidelity and safety: the power conversion and management subsystem.
This article employs a systematic and co-design mindset to deeply analyze the core challenges within the power path of flying car test benches: how, under the multiple constraints of extreme voltage/current ratings, high switching frequency for precision, harsh EMI environments, and stringent reliability requirements, can we select the optimal combination of power devices for the three key nodes: high-voltage DC stimulus & energy recovery, high-current actuator/dyno drive, and multi-channel auxiliary system power management?
Within the design of a flying car test bench, the power conversion and switching module is the core determining test accuracy, bandwidth, safety, and uptime. Based on comprehensive considerations of bidirectional energy flow for regenerative braking/fan simulation, transient high-current handling for torque ripple, system isolation, and robust thermal management, this article selects three key devices from the component library to construct a hierarchical, complementary power solution.
I. In-Depth Analysis of the Selected Device Combination and Application Roles
1. The Core of the High-Voltage Stress Stimulus: VBP117MC06 (1700V SiC MOSFET, 6A, TO-247) – Bidirectional High-Voltage DC Source/Sink Main Switch
Core Positioning & Topology Deep Dive: This device is pivotal for simulating the high-voltage DC bus of a flying car's powertrain (often ~800V to 1kV) and managing regenerative energy flow back to the grid or storage. Its 1700V rating provides critical margin for voltage spikes during switching transients and fault conditions inherent in test environments. The SiC technology enables operation at very high switching frequencies (50kHz-200kHz+), crucial for high-bandwidth, high-fidelity power amplifier stages in test systems that must replicate fast transients from propulsors or traction inverters.
Key Technical Parameter Analysis:
Ultra-High Voltage & SiC Advantage: The 1700V VDS safely encompasses the high-voltage DC link with ample derating. SiC's near-zero reverse recovery charge and high-temperature stability drastically reduce switching losses, enabling efficient, compact, and cool-running high-voltage converters.
Low Rds(on) for its Voltage Class: 1500mΩ @ 18V is competitive, keeping conduction losses manageable in medium-current paths typical of stimulus sources.
Selection Trade-off: Compared to series-connected lower-voltage Si IGBTs or MOSFETs (complex balancing, slower), this single SiC MOSFET offers simplicity, superior speed, and efficiency, justifying its cost for mission-critical test accuracy and reliability.
2. The Backbone of High-Current Load Simulation: VBL1615A (60V, 120A, TO-263) – Dynamometer/Actuator Drive Inverter Low-Side Switch
Core Positioning & System Benefit: As the core switch in low-voltage, ultra-high-current three-phase inverter bridges driving dynamometers, mechanical load simulators, or environmental chamber actuators, its exceptionally low Rds(on) of 7mΩ @10V is paramount. This directly determines the conduction loss and current fidelity of the load simulation circuit. Under high-torque, high-cyclic-duty test profiles:
High Efficiency & Power Density: Minimizes energy loss and heat generation within the test bench itself, reducing cooling demands and facility energy costs.
Exceptional Peak Current Capability: The TO-263 package with extremely low internal resistance allows for very high pulsed currents, accurately simulating sudden load demands like landing impact or rapid acceleration.
Enhanced Signal Fidelity: Low conduction loss correlates with minimal distortion, ensuring the load current waveform precisely follows the command signal for accurate device-under-test (DUT) characterization.
Drive Design Key Points: Despite the low Rds(on), its high current rating demands a gate driver capable of high peak current to charge/discharge the significant Ciss rapidly, minimizing switching losses during high-frequency PWM operation for dynamic load simulation.
3. The Intelligent Auxiliary System Butler: VBMB2251K (-250V, -7A, TO-220F) – Multi-Channel Isolated/High-Side Auxiliary Power & Sensor Supply Switch
Core Positioning & System Integration Advantage: This single P-MOSFET in an isolated package is key to achieving intelligent management and fault isolation for medium-voltage auxiliary rails and sensor suites within the test bench. Flying car test benches involve numerous isolated sensors (voltage, current, vibration), safety interlocks, and controller subsystems that require reliable, switched power rails.
Application Example: Enables sequenced power-up of different test stand sections, provides hard-wired emergency shutdown (ESD) control, or isolates faulty sensor clusters without affecting the entire system.
Reason for P-Channel Selection: As a high-side switch for positive rails up to 250V, it can be controlled directly by opto-isolators or low-voltage logic with a simple level shifter, providing a robust and straightforward isolation barrier. This is crucial for safety and noise immunity in the electrically noisy test environment.
Package Benefit: The TO-220F fully isolated package simplifies heatsinking and improves creepage/clearance distances, enhancing reliability in dense, high-potential test equipment.
II. System Integration Design and Expanded Key Considerations
1. Topology, Drive, and Control Loop
High-Voltage SiC Source & Digital Controller Coordination: The drive for VBP117MC06 must be a high-speed, isolated gate driver with precise dead-time control and desaturation protection. Its switching must be tightly synchronized with the high-bandwidth controller of the programmable DC source/load.
High-Fidelity Control of Load Inverter: As the final execution unit for dynamic load profiles, the switching consistency and speed of VBL1615A are critical for minimizing current ripple and phase delay. Matched, high-current gate drivers are essential.
Intelligent & Safe Auxiliary Management: The gate of VBMB2251K is controlled via isolated digital outputs from the Test Sequencer or Safety PLC, enabling soft-start for capacitive sensor loads and instant shutdown upon fault detection.
2. Hierarchical Thermal Management Strategy
Primary Heat Source (Forced Liquid/Air Cooling): The VBL1615A in the load inverter is the primary heat source due to its very high current, requiring a low-thermal-impedance heatsink, potentially liquid-cooled for high-duty-cycle tests.
Secondary Heat Source (Forced Air Cooling): The VBP117MC06, while efficient, concentrates switching loss at high frequency. It requires a dedicated heatsink with attention to low-inductance mounting to preserve SiC switching benefits.
Tertiary Heat Source (Convection/PCB Conduction): VBMB2251K and its control circuits rely on PCB heatsinking. The isolated package allows direct mounting to a chassis or heatsink for improved heat dissipation.
3. Engineering Details for Reliability Reinforcement
Electrical Stress Protection:
VBP117MC06: In high-speed SiC circuits, careful attention to PCB layout (minimizing loop inductance) is more critical than ever. RC snubbers may be used to dampen ringing caused by parasitic inductance.
VBL1615A: Protection against inductive kickback from motorized loads is essential, using freewheeling diodes and bus capacitors.
VBMB2251K: TVS diodes on the switched output protect against transients from long sensor cable runs.
Enhanced Gate Protection: Robust gate protection for all devices is non-negotiable. Use gate series resistors, clamp Zeners, and strong pull-downs. For SiC (VBP117MC06), a negative turn-off voltage (e.g., -5V) is recommended for enhanced noise immunity.
Derating Practice:
Voltage Derating: VBP117MC06 operating VDS should be below 1360V (80% of 1700V); VBL1615A VDS should have margin above the actuator drive bus voltage; VBMB2251K VDS should be derated for the auxiliary rail voltage.
Current & Thermal Derating: Strictly base current ratings on transient thermal impedance and maximum junction temperature (Tjmax), considering the worst-case test profile durations. SiC devices can run hotter but should be derated according to lifetime expectations.
III. Quantifiable Perspective on Scheme Advantages and Competitor Comparison
Quantifiable Test Bandwidth & Fidelity: Using VBP117MC06 (SiC) in the high-voltage source enables switching frequencies 5-10x higher than IGBT-based solutions, directly translating to higher control bandwidth and more accurate replication of high-frequency components in flight power profiles.
Quantifiable System Efficiency & Uptime: Using VBL1615A (ultra-low Rds(on)) for the load inverter can reduce conduction loss by over 40% compared to standard MOSFETs, reducing thermal stress, cooling system size, and energy consumption during prolonged durability testing.
Quantifiable Safety & Reliability Improvement: Using VBMB2251K for isolated auxiliary power switching provides a clear, reliable isolation barrier and simplifies safety circuit design, reducing the risk of cross-talk and improving overall test stand MTBF.
IV. Summary and Forward Look
This scheme provides a complete, robust power chain for vertiport-integrated flying car test benches, spanning from extreme high-voltage stimulus simulation to ultra-high-current load application and intelligent, isolated auxiliary management. Its essence lies in "matching to extreme demands, optimizing for fidelity and safety":
High-Voltage Stimulus Level – Focus on "Precision & Speed": Leverage SiC technology to achieve the switching speed and voltage robustness needed for high-fidelity aerospace-grade power profile simulation.
High-Current Load Level – Focus on "Fidelity & Density": Invest in ultra-low-loss devices to ensure accurate current reproduction and high power density within the test facility.
Auxiliary Management Level – Focus on "Isolation & Control": Use appropriately rated P-MOSFETs with isolated packages to ensure safe, reliable control of critical test infrastructure power.
Future Evolution Directions:
Enhanced SiC Integration: Transition to SiC MOSFET modules with integrated gate drivers and temperature sensing for the high-voltage and high-current sections, further improving power density and monitoring capabilities.
Wide-Bandgap for Auxiliary Switches: For higher-frequency auxiliary converters within the test bench, consider GaN HEMTs to minimize size and improve efficiency of internal point-of-load converters.
Digital Twin Integration: Embed smarter sensing (current, temperature) at the device level to feed data into a digital twin of the test stand, enabling predictive maintenance and adaptive control.
Engineers can refine and adjust this framework based on specific test bench parameters such as maximum stimulus voltage (e.g., 1kV/1.5kV), peak load current, auxiliary system complexity, and safety certification requirements (e.g., ISO 26262 for automotive, DO-254 for aerospace aspects), thereby designing high-performance, safe, and reliable flying car test and validation systems.

Detailed Power Chain Topology Diagrams

High-Voltage SiC Stimulus & Energy Recovery Topology Detail

graph LR subgraph "Bidirectional High-Voltage DC Source" A["3-Phase 400VAC Input"] --> B["EMI Filter & PFC"] B --> C["High-Voltage DC Link
800-1000VDC"] C --> D["VBP117MC06 SiC MOSFET
1700V/6A"] D --> E["Programmable DC Output
to DUT Powertrain"] E --> F["Flying Car Test Unit
(Device Under Test)"] F --> G["Regenerative Energy"] G --> H["Bidirectional Converter"] H --> D end subgraph "SiC Gate Drive & Control" I["Digital Controller
High-Bandwidth"] --> J["Isolated Gate Driver
Negative Turn-off Voltage"] J --> D K["DC Link Voltage Feedback"] --> I L["Output Current Sensing"] --> I M["Desaturation Detection"] --> J N["Temperature Monitoring"] --> I end subgraph "Protection & Snubber" O["RC Snubber Network"] --> D P["TVS Protection"] --> J Q["Over-Current Protection"] --> I end style D fill:#e8f5e8,stroke:#4caf50,stroke-width:2px

High-Current Dynamometer Drive Inverter Topology Detail

graph LR subgraph "Three-Phase Inverter Bridge (Low-Side)" A["48-60VDC Bus"] --> B["DC-Link Capacitors"] B --> C["Phase U Leg"] B --> D["Phase V Leg"] B --> E["Phase W Leg"] subgraph "Phase U Switch" F["VBL1615A
60V/120A
Rds(on)=7mΩ"] end subgraph "Phase V Switch" G["VBL1615A
60V/120A
Rds(on)=7mΩ"] end subgraph "Phase W Switch" H["VBL1615A
60V/120A
Rds(on)=7mΩ"] end C --> F D --> G E --> H F --> I["U Phase Output"] G --> J["V Phase Output"] H --> K["W Phase Output"] I --> L["Dynamometer Load
High-Torque Simulation"] J --> L K --> L end subgraph "Gate Drive & Control" M["High-Fidelity PWM Controller"] --> N["High-Current Gate Driver
Fast Switching"] N --> F N --> G N --> H O["Current Sensing
High Precision"] --> M P["Temperature Monitoring"] --> M end subgraph "Protection Circuits" Q["Freewheeling Diodes"] --> F R["Bus Capacitors
for Inductive Kickback"] --> B S["Gate Protection
Series R + Zener"] --> N end style F fill:#e3f2fd,stroke:#2196f3,stroke-width:2px style G fill:#e3f2fd,stroke:#2196f3,stroke-width:2px style H fill:#e3f2fd,stroke:#2196f3,stroke-width:2px

Intelligent Auxiliary Power Management Topology Detail

graph LR subgraph "High-Side P-MOSFET Switch Channels" A["Auxiliary DC Supply
Up to 250VDC"] --> B["Channel 1: Sensor Power"] A --> C["Channel 2: Safety Systems"] A --> D["Channel 3: Control Units"] subgraph "Sensor Power Switch" E["VBMB2251K P-MOSFET
-250V/-7A
TO-220F Isolated"] end subgraph "Safety Systems Switch" F["VBMB2251K P-MOSFET
-250V/-7A
TO-220F Isolated"] end subgraph "Control Units Switch" G["VBMB2251K P-MOSFET
-250V/-7A
TO-220F Isolated"] end B --> E C --> F D --> G E --> H["Isolated Sensor Arrays
Voltage/Current/Vibration"] F --> I["Emergency Shutdown Circuits
Safety Interlocks"] G --> J["Test Sequencer
Data Acquisition
PLC Controllers"] end subgraph "Control & Isolation" K["Test Sequencer/Safety PLC"] --> L["Opto-Isolators
Level Shifters"] L --> M["Gate Drive Signals"] M --> E M --> F M --> G N["Fault Detection Inputs"] --> K O["Sequenced Power-Up Control"] --> K end subgraph "Protection & Monitoring" P["TVS Diodes
for Cable Transients"] --> H Q["Soft-Start Circuits"] --> E R["Current Limiting"] --> F S["Thermal Monitoring"] --> G end style E fill:#fff3e0,stroke:#ff9800,stroke-width:2px style F fill:#fff3e0,stroke:#ff9800,stroke-width:2px style G fill:#fff3e0,stroke:#ff9800,stroke-width:2px
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